C - Chemistry – Metallurgy – 07 – D
Patent
C - Chemistry, Metallurgy
07
D
C07D 309/12 (2006.01) C08F 24/00 (2006.01) G03F 7/039 (2006.01)
Patent
CA 2080365
2080365 9115810 PCTABS00007 Excellent resolution and sensitivity in the patterning of resists utilized in device and mask manufacture is obtained with a specific composition. In particular this composition involves polymers having recurring pendant acid labile .alpha.-alkoxyalkyl carboxylic acid ester moieties in the presence of an acid generator activated by actinic radiation such as UV-visible, deep ultraviolet, e-beam and x-ray radiation.
Hertler Walter Raymond
Sogah Dotsevi Yao
Taylor Gary Newton
American Telephone And Telegraph Company
Du Pont Photomasks Inc.
Sim & Mcburney
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