Resistive glass structures used to shape electric fields in...

H - Electricity – 01 – J

Patent

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H01J 3/14 (2006.01) H01J 9/00 (2006.01) H01J 49/06 (2006.01) H01J 49/26 (2006.01) H01J 49/40 (2006.01)

Patent

CA 2581463

A reflectron lens for a time-of-flight mass spectrometer is disclosed. The reflectron lens includes a glass tube having a conductive surface along the length of the tube. The conductive surface has an electrical resistance gradient along its length. The electrical resistance gradient provides an electric field interior to the tube that varies in strength along the length of the tube when an electric potential is applied to opposing ends of the tube. A mass spectrometer incorporating the reflectron lens, a method of making the reflectron lens, and an apparatus for removing lead from the surface of a lead silicate glass tube are also disclosed.

La présente divulgation porte sur une lentille de réflectron pour spectromètre de masse à temps de vol. Cette lentille comprend un tube de verre présentant une surface conductrice le long du tube. La surface conductrice présente un gradient de résistance électrique sur sa longueur. Ce gradient fournit à l'intérieur du tube un champ électrique qui varie en intensité le long du tube, à l'application d'un potentiel électrique aux extrémités opposées du tube. La présente divulgation porte aussi sur un spectromètre de masse comprenant la lentille du réflectron, sur une méthode de réalisation de ladite lentille et sur un dispositif qui permet d'éliminer le plomb de la surface d'un tube de verre au silicate de plomb.

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