Rosette-type optical microsystem of strain gauges having...

Details Rosette-type optical microsystem of strain gauges having... Rosette-type optical microsystem of strain gauges having...

G - Physics

01

L

G01L 1/24 (2006.01)

Patent

CA 2162954

The present invention relates to a planar, rosette-type, optical microsystem with strain gauges having dielectric guides used for measuring a system of strains or stresses applied to a part, in which the part is under purely longitudinal strain, at least one rosette being formed by at least two strain gauges with dielectric guides (J1, J2, J3) and in which a calculating circuit makes it possible to determine said strain by resolving a system of equations.

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