Sample analysis apparatus and a method of analysing a sample

G - Physics – 01 – N

Patent

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Details

G01N 21/51 (2006.01) G01N 15/02 (2006.01) G01N 21/03 (2006.01) G01N 21/82 (2006.01) G01N 21/53 (2006.01) G01N 21/65 (2006.01)

Patent

CA 2742162

The invention relates to a sample analysis apparatus. The apparatus comprises: a radiation system to irradiate the sample in a vial and an analyser with a camera to analyse the radiation received from the sample in the vial. The apparatus is provided with a holder to releasable hold the vial and with an optical path for the radiation system to irradiate the sample and for the camera to make images of the sample. The radiation system can be used for front lighting of the sample in the vial or for back lighting of the sample in the vial. The camera may be provided with a telecentric lens.

L'invention porte sur un appareil d'analyse d'échantillon. L'appareil comprend un système de rayonnement pour irradier l'échantillon dans un flacon et un analyseur avec une caméra pour analyser le rayonnement reçu en provenance de l'échantillon dans le flacon. L'appareil comporte un support pour supporter de façon libérable le flacon et un trajet optique pour que le système de rayonnement irradie l'échantillon et pour que la caméra prenne des images de l'échantillon. Le système de rayonnement peut être utilisé pour un éclairage de face de l'échantillon dans le flacon ou pour un rétroéclairage de l'échantillon dans le flacon. La caméra peut comprendre une lentille télécentrique.

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