Sample analyzing method and sample analyzing program

Details Sample analyzing method and sample analyzing program Sample analyzing method and sample analyzing program

G - Physics

01

N

G01N 27/62 (2006.01) G01N 30/72 (2006.01)

Patent

CA 2521108

A sample analyzing method and a sample analyzing program for analyzing a component contained in a sample with an excellent analysis ability. The method comprises a step (a) of correcting at least a one-dimensional parameter in multi-dimensional data collected by analyzing a sample and a step (b) of comparing the corrected data obtained at step (a) with data on other samples.

L'invention concerne un procédé et un programme d'analyse d'échantillon permettant d'analyser un composant contenu dans un échantillon. Lesdits procédé et programme présentent une excellente capacité d'analyse. Le procédé selon l'invention consiste : (a) à corriger au moins un paramètre unidimensionnel dans des données multidimensionnelles collectées par l'analyse d'un échantillon ; et (b) à comparer les données corrigées obtenues lors de l'étape (a) avec des données sur d'autres échantillons.

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