G - Physics – 01 – N
Patent
G - Physics
01
N
G01N 1/02 (2006.01)
Patent
CA 2744295
A sample collector (10) for an analysis device for analyzing trace elements, said device comprising a wiping element (16) on which sample material can be wiped from a surface to be tested and can be adsorbed thereon using a wiping process, comprises a support part (14) with a convex surface to which the wiping element (16) is attached. Also described is a sample collection device which uses said sample collector (10), and a method for sampling.
L'invention concerne un collecteur d'échantillons (10) pour un dispositif d'analyse destiné à analyser des éléments traces, comprenant un élément racleur (16) sur lequel une matière échantillon peut être raclée par un processus de raclage sur une surface à contrôler, puis adsorbée. Selon l'invention, ce collecteur d'échantillons (10) comprend un élément support (14) à surface convexe sur lequel l'élément racleur (16) est placé. L'invention concerne en outre un dispositif de collecte d'échantillons comprenant ce collecteur d'échantillons (10), ainsi qu'un procédé de prélèvement d'échantillons.
Beer Sebastian
Kessler Matthias
Legner Wolfgang
Martin Ulrich
Ziemann Thomas
Eads Deutschland Gmbh
Robic
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