Sample element for use in material analysis

G - Physics – 01 – N

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G01N 21/03 (2006.01) G01N 21/35 (2006.01)

Patent

CA 2522282

A system and method are provided for determining a concentration of an analyte in a material sample. The method includes providing a sample element with a sample chamber at least partially defined by at least one window formed from a material having greater than about 1% wavelength-domain variation in absorbtivity of electromagnetic radiation incident thereon. The methot further includes employing the sample element with an analyte detection system which determines the concentration of the analyte with clinically acceptable accuracy.

L'invention concerne un système et un procédé permettant de déterminer une concentration d'analyte dans un échantillon de matériau. Le procédé selon l'invention consiste à doter un élément d'échantillonnage d'une chambre d'échantillonnage définie au moins partiellement par au moins une fenêtre formée dans un matériau présentant une variation de domaine de longueurs d'onde supérieure à environ 1 % pour l'absorptivité du rayonnement électromagnétique qu'il reçoit. Ledit procédé consiste également à utiliser cet élément d'échantillonnage dans un système de détection d'analyte servant à déterminer la concentration de l'analyte avec une précision cliniquement acceptable.

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