Scan control and sensor sampling system for self- scanned...

G - Physics – 04 – C

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G04C 3/00 (2006.01) G04B 27/00 (2006.01) H04N 3/15 (2006.01)

Patent

CA 1091798

SCAN CONTROL AND SENSOR SAMPLING SYSTEM FOR SELF-SCANNED PHOTOSENSOR ARRAYS ABSTRACT OF THE DISCLOSURE A method and system is provided for driving a self- scanned photosensor array and sampling the sensor cells serially addressed by the array [which is compatible with] for integrated circuit arrays where high sensor cell scan rates are employed without compromising either image integrity or array frame rate. End of line (EOL) and end of frame (EOF) timing signals generated by the array are sensed [by a monolithic integrated circuit which] and employed to limit the voltage amplitude swings of the signals to reduce noise modulation in the output video signal, and which forms a single synchro- nization signal accurately identifying the last cell of a frame to be scanned. A row counter is synchronized to provide biphase array clock signals having minimal pulse skew between complementary outputs. The flip-flops uniquely provide large voltage amplitude swings without attendant heat generation problems and reduce the effects of fixed pattern odd/even noise in the output video signal. The sensor cells are serially selected to a wideband, high gain, integrated circuit transresistance video voltage amplifier which converts the recharge current of the sensor cells to a voltage waveform. The amplifier further presents an apparent impedance to the array at the operating frequencies, thereby accommodating the recharging of a selected sensor cell in a time period small compared to the cell scan period.

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