Scan test circuit using fast transmission gate switch

G - Physics – 06 – F

Patent

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Details

G06F 11/26 (2006.01) G01R 31/3185 (2006.01) H01L 23/532 (2006.01)

Patent

CA 2171307

A fast transmission, integrated circuit switching device responsive to at least one external on/off control signal, and including a first input/output node, and a second input/output node, the switching device operative to pass or block the bidirectional transmission of external data signals between the first node and the second node, the switching device comprising a bidirectional field-effect transistor, a first scan cell; and a second scan cell; whereby input and output data signals of the switching device may be sensed and stored.

Dispositif de commutation d'un circuit intégré à transmission rapide répondant à au moins un signal de commande externe marche/arrêt, qui comprend un premier noeud d'entrée/sortie, et un second noeud d'entrée/sortie. Ledit dispositif de commutation fonctionne pour faire passer ou bloquer la transmision bidirectionnelle de signaux de données externes entre le premier et le second noeud. Ce dispositif de commutation comprend un transistor à effet de champ bidirectionnel, une première cellule de balayage et une seconde cellule de balayage, ce qui permet de détecter et de stocker des signaux de données de sortie du dispositif de commutation.

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