Scannable latch and method of using same

Details Scannable latch and method of using same Scannable latch and method of using same

H - Electricity

01

L

H01L 21/66 (2006.01) H03K 3/037 (2006.01) H03K 3/356 (2006.01)

Patent

CA 2143018

A novel design for a fully static, see-through-latch with buffering is disclosed, which is capable of being configured to act as either a see-through-latch, a flip- flop as an aid to a test scan which will allow data to be scanned in and out of the latches, and an alternative flip-flop as an aid to testing intervening combinatorial logic.

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