Scanning electron beam computed tomography scanner with ion...

Details Scanning electron beam computed tomography scanner with ion... Scanning electron beam computed tomography scanner with ion...

H - Electricity

05

G

358/11.1

H05G 1/00 (2006.01) H01J 35/00 (2006.01) H01J 35/14 (2006.01)

Patent

CA 1207920

ABSTRACT OF THE DISCLOSURE An electron beam production and control assembly espe- cially suitable for use in producing X-rays in a computed tomography X-ray scanning system is disclosed herein. In this system, an electron beam is ultimately directed onto an X-ray producing target in a converging manner using electromagnetic components to accomplish this. The system also includes an arrangement for neutralizing the converg- ing beam in a controlled manner sufficient to cause it to converge to a greater extent than it otherwise would in the absence of controlled neutralization, whereby to provide ion aided focusing.

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