G - Physics – 02 – B
Patent
G - Physics
02
B
88/16, 88/96.8
G02B 21/00 (2006.01)
Patent
CA 2000510
- 89 - ED-0365-A ABSTRACT OF THE DISCLOSURE A scanning laser microscope system for assisting in the detection and characterization of fine details and structures of materials or other samples. The system can have means for enhancing light from the material to assist detection of anomalies, such as inclusions in the material and crystal lattice dislocations. The system can have means for enhancing fluorescent light emitted from the sample. The system can further have very precise means for processing signals representative of light detected from the material. -89-
Hirschle Alfred
Lattibeaudiere Derrick Prince
Livermore Robert Hubbard
Stamford Alan Painter
Taylor John
E.i. Du Pont de Nemours And Company
Sim & Mcburney
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