Scanning system for charged and neutral particle beams

Details Scanning system for charged and neutral particle beams Scanning system for charged and neutral particle beams

G - Physics

21

K

358/22

G21K 5/00 (2006.01) A61N 5/10 (2006.01)

Patent

CA 1150422

ABSTRACT A method and a device for irradiating a confined volume of matter, normally situated at a depth, with a beam of high energy charged or neutral particles. The characteristic feature of the method is that a beam of charged particles coming from a radiation source is scanned electrically in two orthogonal directions. To obtain a scanned beam of neutral particles, for example photons, a scanned beam of electrons is caused to hit a target which then emits a scanned photon beam predominantly in the direction of the in- coming electrons of neutral particles. The device according to the invention includes a beam optical system arranged in the path of a beam of charged particles emerging from a radiation source and having two scanning magnets, each of which admits scanning of the particle beam in one of two orthogonal planes, the scanned beam leaving the last scanning magnet from an effective scanning centre.

354484

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