Scrap detector

Details Scrap detector Scrap detector

G - Physics

01

N

73/55, 341/56

G01N 21/71 (2006.01) G01J 3/28 (2006.01) G01N 21/85 (2006.01)

Patent

CA 1329327

ABSTRACT OF THE DISCLOSURE: For an analysis of metal particles to determine the composition of the particles and for the generation of a sorting signal, a process and an apparatus are proposed in which the particles are exposed to a pulsed laser beam by which they are partly vaporized to form a plasma so that the particles are cleaned and the cleaned area is subse- quently partially vaporized by a pulsed laser beam to form a plasma. The spectral lines of the plasma are inspected for an identification of the composition of the metal particles. The required inspection rate of 30 particles per second can readily be achieved or even exceeded if a defined narrow wavelength range or a defined wavelength is filtered from the total radiation that is emitted by the plasma and the intensities of the filtered partial radiations are related to each other to obtain ratios, which are compared with adjustable limiting values. A sorting signal is derived from the result of said com- parison. The inspection rate can be improved in that the partial radiation is subjected to a comparison only for a defined interval of time.

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