Secondary ion generator detector for time-of-flight mass...

H - Electricity – 01 – J

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H01J 49/02 (2006.01) H01J 49/10 (2006.01) H01J 49/40 (2006.01)

Patent

CA 2304868

An ion detector includes a secondary charged particle generator that generates secondary charged particles in response to primary ions that engage the secondary charged particle generator. The secondary charged particle generator has an electrostatic potential that repels the secondary charged particles toward an electro-emissive detector that generates electrons in response to primary ions and secondary charged particles that engage the electro-emissive detector. The electro-emissive detector has a field that attracts the secondary charged particles. An anode is provided for detecting electrons generated by the electro-emissive detector and for generating a signal.

Un détecteur d'ions comprend un générateur de particules chargées secondaires qui génère des particules chargées secondaires en réponse à des ions primaires qui entrent dans le générateur de particules chargées secondaires. Le générateur de particules chargées secondaires comprend un potentiel électrostatique qui repousse les particules chargées secondaires vers un détecteur émettant des électrons qui génère des électrons en réponse aux ions primaires et aux particules chargées secondaires qui entrent dans le détecteur émettant des électrons. Ce détecteur émettant des électrons comporte un champ qui attire les particules chargées secondaires. Une anode est prévue pour détecter les électrons générés par le détecteur émettant des électrons et pour générer un signal.

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