Seimiconductor device evaluation apparatus

Details Seimiconductor device evaluation apparatus Seimiconductor device evaluation apparatus

G - Physics

01

R

G01R 31/28 (2006.01) G01R 31/315 (2006.01)

Patent

CA 2275799

A semiconductor device evaluation apparatus is provided with a test board. A print wiring is provided at a first surface of the test board on which a semiconductor device is mounted. A terminal of the semiconductor device is connected to the print wiring. A power circuit is provided at a second surface opposite to the first surface of the test board The power circuit is connected to the print wiring and actuating the semiconductor device. The apparatus is also provided with a magnetic field detector arranged above the print wiring and detecting a magnetic field generated from the print wiring. Further, the apparatus is provided with a current detector detecting a value of current carried through the print wiring in association with the magnitude of the magnetic field detected by the magnetic field detector.

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