Selective modification of individual nanometer and...

Details Selective modification of individual nanometer and... Selective modification of individual nanometer and...

G - Physics

11

B

G11B 9/00 (2006.01)

Patent

CA 2070210

O.Z. 0050/42487 Abstract of the Disclosure: A process for the selective modification and reversible removal of extremely fine structures having dimensions of down to the nanometer and subnanometer range from the surface of a solid, comprises moving the fine tip of a probe, for example a surface- sensitive scanning probe, which is located at a distance in the .ANG.ngstrom range above the surface or is in contact with the surface, over the structure at essentially the same height and thus causing a change in this structure.

Affiliated with

Also associated with

Rating

Selective modification of individual nanometer and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Selective modification of individual nanometer and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Selective modification of individual nanometer and... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1861031