Self-aligned field-effect transistor for high frequency...

H - Electricity – 01 – L

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Details

H01L 29/772 (2006.01) H01L 21/04 (2006.01) H01L 21/283 (2006.01) H01L 29/417 (2006.01) H01L 29/812 (2006.01)

Patent

CA 2199948

A metal-semiconductor field-effect-transistor (MESFET) is disclosed that exhibits reduced source resistance and higher operating frequencies. The MESFET comprises an epitaxial layer of silicon carbide, and a gate trench in the epitaxial layer that exposes a silicon carbide gate surface between two respective trench edges. A gate contact is made to the gate surface, and with the trench further defines the source and drain regions of the transistor. Respective ohmic metal layers form ohmic contacts on the source and drain regions of the epitaxial layer, and the edges of the metal layers at the trench are specifically aligned with the edges of the epitaxial layer at the trench.

L'invention concerne un transistor MESFET présentant une résistance de source réduite et des fréquences de fonctionnement supérieures. Ce transistor MESFET comprend une couche épitaxiale en carbure de silicium et une tranchée de grille dans la couche épitaxiale découvrant une surface de grille en carbure de silicium entre deux bords respectifs de tranchée. Un contact de grille est créé dans la surface de grille et définit, avec la tranchée, les régions de source et de drain du transistor. Des couches ohmiques respectives en métal constituent des contacts ohmiques sur les régions de source et de drain de la couche épitaxiale et les bords des couches en métal au niveau de la tranchée sont alignés spécifiquement sur les bords de la couche épitaxiale au niveau de la tranchée.

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