H - Electricity – 01 – L
Patent
H - Electricity
01
L
H01L 27/108 (2006.01) H01L 21/02 (2006.01) H01L 21/8242 (2006.01) H01L 27/115 (2006.01)
Patent
CA 2113958
In a semiconductor device having a ferroelectric capacitor and manufacturing method thereof, a spacer comprising a low dielectric material is formed on the side surfaces of a plurality of lower electrodes separated into each cell unit, and a ferroelectric film is formed on the lower electrodes whereon the low dielectric material spacer is formed, and an upper electrode is formed on the ferroelectric film, to thereby prevent an error which may be caused between the adjacent lower electrodes.
Kang Chang-Seok
Kwon Kee-Won
Ridout & Maybee Llp
Samsung Electronics Co. Ltd.
LandOfFree
Semiconductor device and method for manufacturing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device and method for manufacturing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method for manufacturing the same will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-2036970