Semiconductor device testing apparatus

Details Semiconductor device testing apparatus Semiconductor device testing apparatus

G - Physics

01

R

G01R 31/26 (2006.01) G01R 31/28 (2006.01)

Patent

CA 2073078

ABSTRACT OF THE DISCLOSURE An object of the present invention is to provide a testing apparatus which assures that a constant acceleration test and an AC continuous operation test can be simultaneously conducted on semiconductor devices to be tested. The testing apparatus includes a rotatable turntable with semiconductor devices to be tested mounted thereon, rotary terminals electrically connected to connection pins of the semiconductor devices mounted on the turntable and adapted to rotate together with the turntable, and stationary terminals adapted to intermittently or continuously slidably contact the rotary terminals while the turnable is rotated. -18-

Affiliated with

Also associated with

Rating

Semiconductor device testing apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device testing apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device testing apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1498622