Semiconductor laser device

H - Electricity – 01 – S

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H01S 5/12 (2006.01) H01S 5/223 (2006.01) H01S 5/343 (2006.01)

Patent

CA 2249053

On an n-GaAs substrate are sequentially formed an n-GaAs buffer layer, an n-AlGaAs cladding layer, a non-doped InGaAs active layer, a p-Al x Ga1-xAs cladding layer, a p-GaAs contact layer, and further an n-AlGaAs current blocking layer having a stripe-like window is embedded in the cladding layer. At the active layer side interface of the current blocking layer, a diffraction grating of cyclic bumps and dips shape is formed, but the diffraction grating is not formed in a region of the stripe-like window where the current blocking layer is not present, i.e., a current injection region. In this way, a semiconductor laser device of low oscillation threshold, high oscillation efficiency, high reliability, long life time, and stabilized oscillation wavelength can be realized.

Sur un substrat de n-GaAs sont formées séquentiellement une couche d'amortissement de n-GaAs, une couche de métallisation de n-AlGaAs, une couche active d'InGaAs non dopée, une couche de métallisation p-Al x Gal-xAs, une couche de contact p-GaAs. En outre, une couche de blocage de courant de n-AlGaAs ayant une fenêtre en forme de bande est intégrée à la couche de métallisation. € l'interface côté couche active de la couche de blocage de courant, un réseau de diffraction à saillies et chutes cycliques est formé, mais il ne se trouve pas dans une zone de ladite fenêtre où la couche de blocage de courant est absente, c.-à-d. une zone d'injection de courant. Il est ainsi possible de réaliser un dispositif laser à semiconducteurs à faible seuil d'oscillation, haute efficacité d'oscillation, haute fiabilité, longue durée de vie et longueur d'onde d'oscillation stabilisée.

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