H - Electricity – 01 – L
Patent
H - Electricity
01
L
356/188
H01L 21/66 (2006.01) G01R 31/26 (2006.01) G01R 31/28 (2006.01)
Patent
CA 1093705
IMPROVED SEMICONDUCTOR TESTER Abstract of the Disclosure An apparatus for testing the operating state of single and multiple semiconductor junctions, either in or out of circuit. The tester lncludes a testing circuit which in turn includes a transformer having a secondary with plurality of voltage tap leads which are selectively connectable by a switching device to a resistance and voltage divider array, which includes means adapted to receive the junction to be tested. The output of the testing circuit is applied to a display circuit which includes a visual indicator, which in turn produces a trace having a con- figuration representative of the forward and reverse characteristics of the function for inspection by an operator. The variety of voltages available at the secondary of the transformer and the variety of resistance and voltage divider combinations available permit the safe testing of a wide variety of junctions, including multiple junction.
276204
Frayne & Company Robert
Huntron Instruments Inc.
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