Sensitivity of iterative spectrally smooth...

Details Sensitivity of iterative spectrally smooth... Sensitivity of iterative spectrally smooth...

G - Physics

01

J

G01J 5/00 (2006.01) G01J 5/60 (2006.01)

Patent

CA 2416266

A method for estimating the error statistic for retrieved temperature and emissivity of a surface material includes determining the second order analytical error propagation from a measured radiance that differs from the true radiance by additive gaussian noise, which is independent in each band. The radiance error is translated into a diagonal covariance matrix and an analytical estimate results in a determination of the standard deviation and bias of surface temperature. Further, the method for estimating the error statistic utilizes Monte Carlo simulation from a sufficiently large ensemble of radiance spectra for the retrieved surface temperature and emissivity. Temperature and emissivity of the surface material were retrieved using ISSTES algorithm.

La présente invention porte sur un procédé permettant de calculer la statistique d'erreur concernant la température et l'émissivité obtenues d'un matériau superficiel. A cet effet, on commence par calculer la propagation d'erreur analytique du second ordre sur la base d'une radiance mesurée qui s'écarte de la radiance vraie à raison du bruit gaussien additif, ce qui est indépendant d'une bande à l'autre. On traduit l'erreur de radiance en matrice de covariance diagonale et le résultat d'analyse aboutit à un calcul de l'écart type et de l'inflexion de la température superficielle. En outre, le procédé de calcul de la statistique d'erreur fait intervenir une simulation Monte Carlo partant d'un ensemble suffisamment grand de spectres de radiance correspondant à la température et l'émissivité superficielles obtenues. Pour obtenir cette température et cette émissivité du matériau superficiel, on a eu recours à un algorithme ISSTES (Iterative Spectrally Smooth Temperature-Emissivity Separation).

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