C - Chemistry – Metallurgy – 12 – Q
Patent
C - Chemistry, Metallurgy
12
Q
C12Q 1/68 (2006.01) C07H 21/00 (2006.01) C12N 15/10 (2006.01) C12M 1/34 (2006.01) H01J 37/26 (2006.01)
Patent
CA 2701726
This invention relates to using an electron microscope to sequence by direct inspection of labeled, stretched DNA. This method will have higher accuracy, lower cost, and longer read length than current DNA sequencing methods.
L'invention concerne l'utilisation d'un microscope électronique pour le séquençage par inspection directe d'ADN étiré marqué. Ce procédé offre une plus grande précision, des coûts moindres et une longueur de lecture plus importante que les procédés de séquençage d'ADN courants.
Andregg Michael
Andregg William
Halcyon Molecular
Ridout & Maybee Llp
LandOfFree
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