G - Physics – 01 – B
Patent
G - Physics
01
B
G01B 11/16 (2006.01) G01B 11/25 (2006.01)
Patent
CA 2356202
Apparatus and a method for inspecting a tpology of a surface (2) of a structural member (1) are provided. The degree to which a known type of stress has been applied to the member may be ascertained using a Moiré grid (8). The method involves providing a range of calibration samples of structurally equivalent members, the samples each having been subject to the known type of stress to a differing respective degree. Measurements taken using the apparatus and method of the invention are then compared with measurements taken from a calibration sample to determine the amount of stress which has been applied.
L'invention concerne un procédé de contrôle topologique d'une surface (2) d'un élément de structure (1). Le niveau auquel un type de contrainte connu a été appliquée sur ledit élément est mesuré au moyen d'un réseau moiré (8). Le procédé consiste à obtenir une gamme d'échantillons de référence d'éléments structuralement équivalents, chaque échantillon étant soumis audit type de contrainte connu, à divers degrés respectifs. Les mesures prises au moyen de l'appareil et du procédé de l'invention sont ensuite comparées avec des mesures obtenues d'un échantillon de référence pour déterminer le niveau de contrainte appliqué.
Ibbotson Andrew Robert
O'brien Edwin William
Airbus Operations Limited
Bae Systems Plc
Fetherstonhaugh & Co.
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