Shaping ate bursts, particularly in gallium arsenide

G - Physics – 01 – R

Patent

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Details

G01R 31/3183 (2006.01) G01R 31/319 (2006.01) G01R 31/3193 (2006.01)

Patent

CA 2127192

An improved ATE and methods are provided by forming and comparing pattern bursts digitally in gallium arsenide IC's. A desired burst waveform at the DUT terminal is facilitated by setting into timing generators between bursts in effect a plurality of period waveforms constituting a palette from which by successive choice the DUT-terminal driver and comparator waveforms may be built up, each period driver waveform including a predetermined number (including zero) of rising or falling edges, any particular such edge in any particular period driver waveform being provided by the timing generators and each period comparator waveforms including voltage levels to be compared and edges provided through the timing generators, the timing generators being settable only between bursts, selection of desired palette waveforms being provided for each period by a pattern memory.

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