Sheet inspection apparatus and methods providing...

Details Sheet inspection apparatus and methods providing... Sheet inspection apparatus and methods providing...

G - Physics

01

N

73/55

G01N 21/89 (2006.01) G01N 21/86 (2006.01)

Patent

CA 1320842

ABSTRACT Disclosed are sheet inspection apparatus and methods for rapid, repetitive measurement of a quality attribute in each of a plurality of measurement zones of a continuously-manufactured sheet of material, wherein measurement is based on the interaction of one or more radiation wavelength bands with one or more constituents of the sheet. Simultaneous resolution of measurement zones is provided in both scanning and non-scanning applications. R870060

571775

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