Signal distributor test arrangement

H - Electricity – 04 – M

Patent

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Details

324/21, 324/58

H04M 3/26 (2006.01) G01R 31/02 (2006.01) H04M 3/24 (2006.01)

Patent

CA 1146631

GAWRON,L. 3-1-1 13. SIGNAL DISTRIBUTOR TEST ARRANGEMENT ABSTRACT OF THE DISCLOSURE An arrangement for testing relay contacts of a signal distributor is disclosed. The output relay contacts are coupled via isolation diodes to a common circuit node and the input relay contacts are coupled to a second node. A potential is applied to the first node through the diodes and contacts to a single scan point and selective operation of each distributor relay can be verified at the scan point. By reversing the nodes, the integrity of the diodes can be checked. Make, break, and transfer contacts are tested.

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