H - Electricity – 01 – L
Patent
H - Electricity
01
L
345/22, 356/90
H01L 21/20 (2006.01) C23C 16/24 (2006.01) H01L 21/205 (2006.01) H01L 29/04 (2006.01) H01L 29/167 (2006.01) H01L 31/20 (2006.01)
Patent
CA 1175583
ABSTRACT OF THE DISCLOSURE Silicon thin film is composed of primarily silicon atoms, at least one element selected from a group including fluorine, chlorine, bromine, iodine and hydrogen, and impurity element, wherein microcrystalline grains are interspersed in the amorphous layer. The thin film is produced by a method of pro- ducing a silicon thin film on a substrate under the plasma atmosphere using as a raw material any one of silane (SiH4) or halogenated silane (SiH0-3X4-1) wherein X represents halogen element, or a combination of two or more thereof, and a dopant gas mixed with the raw mater- ial. The method comprises steps of; diluting said mixed gas with rare gas such as helium, neon, argon, etc. or hydrogen in a ratio of the diluting gas to the mixed gas higher than 1:1 in order to control the film forming rate adequately enough to produce a layer including mixed crystalline and amorphous substances; and applying an electric power of a plasma discharge power density higher than about 0.2 W/cm2.
387901
Iijima Shigeru
Matsuda Akihisa
Matsumura Mitsuo
Tanaka Kazunobu
Yamamoto Hideo
Agency Of Industrial Science And Technology Ministry Of International Trade And Industry
Gowling Lafleur Henderson Llp
Toa Nenryo Kogyo K.k.
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