Simultaneous analysis of two data sets from a formation test

Details Simultaneous analysis of two data sets from a formation test Simultaneous analysis of two data sets from a formation test

G - Physics

01

V

G01V 9/00 (2006.01) E21B 47/06 (2006.01)

Patent

CA 2650081

Disclosed herein are methods, systems, and devices for determining parameters of an earth formation. Pressure transient data from a formation test can be recorded and analyzed using an analytical model including one or more correction factors derived from an assumption that an induced flow within the formation is hemispherical. Regression analysis of the refined analytical model and the pressure transient data results in accurate earth formation parameters.

Affiliated with

Also associated with

Rating

Simultaneous analysis of two data sets from a formation test does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Simultaneous analysis of two data sets from a formation test, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Simultaneous analysis of two data sets from a formation test will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFCA-PAI-O-1454172