Solid state microscope

H - Electricity – 04 – N

Patent

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88/21, 350/32

H04N 7/18 (2006.01) G01N 21/59 (2006.01) G02B 21/00 (2006.01)

Patent

CA 1304612

ABSTRACT OF THE DISCLOSURE A solid state microscope for viewing and scanning microscopic objects. The solid state microscope has a light source with a condensor and diffusion filter. A moveable stage is provided to allow X, Y, Z plane displacements in order to scan objects under the microscope. There is an objective to magnify the image of the object and project this image onto a two dimen- sional solid state image sensor. the solid state image sensor sends signals to an analog-to-digital converter where the signal, are digitized and sent to a frame memory. A monitor is used to display the image of the object as stored in frame memory. The present invention can be interfaced with a computer to allow for automatic focusing and scanning of an image. The computer also houses storage means to store image. Methods of scanning an object are also described. A prism element can be used to obtain sepctral scans of an object. In another scanning method, a first edge row of pixels is used to detect an object of interest in the scanned image. This first detection row activates an area of the sensor array at a-later time to capture the entire image. In this way, only relevant information is collected and processed. -32-

575314

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