Specific absorption rate measurement system and method

G - Physics – 01 – R

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

G01R 29/00 (2006.01) G01R 29/08 (2006.01) H04B 17/00 (2006.01)

Patent

CA 2607251

A disclosed specific absorption rate measurement system according to an embodiment of the present invention measures a specific absorption rate of electromagnetic waves from a radiating source absorbed in a dielectric medium. The system includes a measurement portion that measures a first electric field vector on an observation surface which is a two-dimensional surface in the dielectric medium; an electric field calculation portion that calculates a second electric field vector in a point excluded from the observation surface in accordance with electric field components of the first electric field vector measured on the observation surface, the electric field components being parallel to the observation surface; and a calculation portion that calculates the specific absorption rate from the calculated second electric field vector.

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

Specific absorption rate measurement system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Specific absorption rate measurement system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Specific absorption rate measurement system and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-1759302

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.