G - Physics – 01 – R
Patent
G - Physics
01
R
G01R 29/00 (2006.01) G01R 29/08 (2006.01) H04B 17/00 (2006.01)
Patent
CA 2607251
A disclosed specific absorption rate measurement system according to an embodiment of the present invention measures a specific absorption rate of electromagnetic waves from a radiating source absorbed in a dielectric medium. The system includes a measurement portion that measures a first electric field vector on an observation surface which is a two-dimensional surface in the dielectric medium; an electric field calculation portion that calculates a second electric field vector in a point excluded from the observation surface in accordance with electric field components of the first electric field vector measured on the observation surface, the electric field components being parallel to the observation surface; and a calculation portion that calculates the specific absorption rate from the calculated second electric field vector.
Iyama Takahiro
Kiminami Katsuki
Onishi Teruo
Fetherstonhaugh & Co.
Ntt Docomo Inc.
LandOfFree
Specific absorption rate measurement system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Specific absorption rate measurement system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Specific absorption rate measurement system and method will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1759302