Spectrometers

G - Physics – 01 – J

Patent

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73/0.5

G01J 3/42 (2006.01) G01N 21/77 (2006.01) G01J 3/28 (2006.01) G01N 21/55 (2006.01)

Patent

CA 1301470

Abstract Improvements relating to spectrometers A method and apparatus for analysing the spectrum of light reflected by a reflecting structure (24) in which the effect upon the analysis results of variation in the angle between the reflecting structure and the incident beam (22) is minimised. The method and apparatus may utilise a dispersive element (26) constructed and arranged so as to minimise the effect of the variations. The method and apparatus may also utilise a calibration technique in which light with a known spectrum is reflected off the reflecting structure and analysed so that compensation may be made for the effect of the variation.

542948

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