G - Physics – 01 – J
Patent
G - Physics
01
J
G01J 3/45 (2006.01) G01J 3/453 (2006.01)
Patent
CA 2302994
Static Fourier transform spectrometers, as well as multichannel dispersive spectrometers, usually have a relatively low value of the product of resolving power and relative free spectral range. This value is limited by the number of pixels in a line of the detector array used in the spectrometer. In this invention, a substantial increase of the SR-factor over the prior art static Fourier spectrometers is provided by means of introducing a stepped retardation in a static double beam Michelson or Mach-Zender interferometer with two-dimensional detector array. The stepped retardation can be introduced into the interferometers by using a stepped-profile reflective (10) or refractive element into one of the interferometer arms. A two-dimensional interference pattern that contains folded interferograms is formed on the detector plane, captured by the detector array, and digitized by the analog-to-digital converter in the signal processing unit. Then the interferogram, as a function of the light intensity vs. linearly increasing retardation, can be reconstructed by merging the folded interferograms corresponding to adjacent lines of the interference pattern together, and the original spectrum of the analyzed radiation can be retrieved by applying the Fourier transform to the reconstructed interferogram.
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