Statistical modeling to analyze large data arrays

G - Physics – 06 – F

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G06F 17/18 (2006.01) G01N 35/00 (2006.01) G06F 19/00 (2006.01)

Patent

CA 2421221

A method for analyzing large data arrays is provided. In one aspect, the invention provides a method for analysing data from two or more data arrays. Each array includes a plurality of members, each member provides a signal, and the data is indexed by one or more parameters. In one embodiment, the method includes fitting a model to the data; determining the goodness of the fit by evaluating the statistical significance of the fit; and determining the statistical significance of the signal. In another embodiment, the method further includes correcting the data for heterogeneity among members prior to fitting the model to the data.

L'invention concerne un procédé permettant d'analyser des grands tableaux de données. Un des aspects de l'invention concerne un procédé permettant d'analyser les données d'au moins deux tableaux de données. Chaque tableau comprend une pluralité d'éléments, et chaque élément produit un signal, et les données sont indexées selon un ou plusieurs paramètres. Dans un mode de mise en oeuvre, ce procédé consiste à ajuster un modèle aux données, à déterminer la validité de cet ajustement par une évaluation statistique de l'ajustement, et à déterminer la signification statistique du signal. Dans un autre mode de mise en oeuvre, ce procédé comprend en outre une correction de l'hétérogénéité des données entre les différents éléments avant l'ajustement du modèle aux données.

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