G - Physics – 01 – M
Patent
G - Physics
01
M
354/28
G01M 7/00 (2006.01)
Patent
CA 1165443
STRUCTURAL LIFE COMPUTER Abstract of the Disclosure This is an electronic device which determines the fatigue life of a structure and its crack growth charac- teristics when subjected to repeated loading by using the signal from an electrical resistance type strain gage secured to the structure to provide the input to a processor which monitors cyclic excursions, calculates the fatigue and fracture structural damage from those excursions, stores the cumulative damage, and displays that damage on command.
388438
Adams Thomas E.
Murray Walter D.
Woolf Raymond F.
Lockheed Corporation
Smart & Biggar
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