Sub-micron particle sampler apparatus and method for...

G - Physics – 01 – N

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

73/97

G01N 1/00 (2006.01) B01D 46/54 (2006.01) B01D 51/10 (2006.01) G01N 1/22 (2006.01)

Patent

CA 1229504

SUB-MICRON PARTICLE SAMPLER APPARATUS AND METHOD FOR SAMPLING SUB-MICRON PARTICLES ABSTRACT A method and apparatus for the collection and sampling of sub-micron particles which allows collection of airborne particles with diameters less than 0.3 micron and includes a collection chamber cooled by liquid nitrogen, and forced air circulation, the air being filtered at the entrance to the collection chamber, moisture and sub-micron diameter particles being frozen in the collection chamber, whereby particles of sub-micron diameter can be detected and identified which otherwise pass through conventional air filters.

478578

LandOfFree

Say what you really think

Search LandOfFree.com for Canadian inventors and patents. Rate them and share your experience with other people.

Rating

Sub-micron particle sampler apparatus and method for... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Sub-micron particle sampler apparatus and method for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sub-micron particle sampler apparatus and method for... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFCA-PAI-O-1251511

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.