G - Physics – 02 – B
Patent
G - Physics
02
B
G02B 1/04 (2006.01) G11B 7/253 (2006.01)
Patent
CA 2592023
The invention relates to a substrate material, characterised in that a charged region on the surface of the corresponding moulding piece with voltages of - 1.5 to +1.5 kV, the proportion of the total surface of which is between 95 and 100 %, charged regions with voltages of -1.5 to -2.5 or +1.5 to +2.5, the proportion of which is 0 to 5 % and charged regions of <-2.5 kV or >+2.5 kV, the proportion of which is up to 1 % of the total surface of the disc are provided, whereby the potential measurement is achieved by means of a Monroe probe at a distance of 3.5 mm from the substrate surface, the scanning region measures 12 cm in both the X- and Y-direction and potentials are measured at each 2 mm in the X- and in the Y-direction.
L'invention concerne un matériau de substrat, caractérisé en ce que la surface d'une pièce moulée correspondante présente des zones de potentiel avec des charges de -1,5 à +1,5 kV, dont la proportion par rapport à la surface totale est comprise entre 95 et 100 %, des zones de potentiel entre -1,5 et -2,5 ou +1,5 à +2,5 kV, dont la proportion est de 0 à 5 %, et des zones de potentiel < -2,5 kV ou > +2,5 kV, dont la proportion maximale s'élève à 1 % de la surface totale du disque, la mesure de potentiel étant effectuée au moyen d'une sonde de Monroe à une distance de 3,5 mm de la surface du substrat, la zone de balayage s'étendant sur 12 cm dans les sens X et Y et le potentiel étant mesuré tous les 2 mm dans les sens X et Y.
Bruder Friedrich-Karl
Haese Wilfried
Meyer Alexander
Prein Michael
Reitze Burkhard
Bayer Materialscience Ag
Fetherstonhaugh & Co.
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