G - Physics – 01 – N
Patent
G - Physics
01
N
354/21
G01N 21/00 (2006.01) G01N 21/89 (2006.01)
Patent
CA 2032349
ABSTRACT OF THE DISCLOSURE By the present invention, at the surface inspection of inspected objects such as band-like running material like metal, paper or textile, without stopping or speed reduction of the inspection line, against the occasional occurrences of defects, the inspected object surface image and defect data are recorded so that at the necessary time the defect data may be reviewed to make a judgement of acceptance or rejection which is highly effective on production controls.
Kanzaka Takashi
Kozuka Yuji
Sugihashi Osamu
Gowling Lafleur Henderson Llp
Hajime Industries Ltd.
Kanzaka Takashi
Kozuka Yuji
Sugihashi Osamu
LandOfFree
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