G - Physics – 01 – N
Patent
G - Physics
01
N
324/53
G01N 27/72 (2006.01) G01B 7/06 (2006.01) G01N 27/90 (2006.01) G01R 33/12 (2006.01)
Patent
CA 2021600
RD 16,987 SWEPT FREQUENCY EDDY CURRENT SYSTEM FOR MEASURING COATING THICKNESS ABSTRACT OF THE DISCLOSURE An apparatus for measuring the thickness of a coating on a substrate has a bridge circuit including four coils. One coil is placed near the coated substrate and another placed near an uncoated substrate of the same mate- rial. An oscillator is connected to the bridge circuit and frequency sweeps, e.g. from 10 KHz to 10 MHz. Phase dif- ferences between the voltages induced in the coils are de- tected to determine conductivity changes with frequency. A method for measuring coating thickness comprises generating variable frequency eddy current in coated and uncoated substrates of the same material and comparing the generated eddy current.
Company General Electric
Craig Wilson And Company
Oliver David W.
LandOfFree
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