Synthetic test circuits for short-circuit testing of...

Details Synthetic test circuits for short-circuit testing of... Synthetic test circuits for short-circuit testing of...

G - Physics

01

R

G01R 31/02 (2006.01) G01R 31/333 (2006.01) H01H 33/04 (2006.01) G01R 31/32 (1990.01)

Patent

CA 2083419

ABSTRACT TRIGGERED SPARK GAP FOR USE IN SYNTHETIC TEST CIRCUITS A triggered spark gap (TSG1) is provided for use in the high current circuit of a synthetic test circuit for short-circuit testing of high voltage alternating current power transission circuit-breakers. A sealed vessel (1) filled in use with electro-negative gas has two inwardly projecting tubular contacts (21, 22) forming a spark gap between carbon nozzles (211, 221) at their inner ends with a trigger electrode (23) in one of the nozzles (221). A pressure chamber to contain an arc initiated by the trigger electrode (23) includes a movable cylinder (30) closed at one end on to one of the contacts (21) and closed on to the other contact (22) via a fixed piston (40), the cylinder (30) carrying a movable contact (50). Arc generated gas pressure expands the pressure chamber so that the movable contact (50) rapidly bridges the tubular contacts (21, 22) to short out the arc. FIGURE NO.3

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