G - Physics – 01 – B
Patent
G - Physics
01
B
G01B 5/02 (2006.01) B25H 7/00 (2006.01) B27G 5/00 (2006.01) B27M 3/00 (2006.01) E04C 3/12 (2006.01) E04G 21/16 (2006.01) G01B 5/04 (2006.01)
Patent
CA 2678269
An apparatus for providing dynamic measurement of an elongated work piece includes at least one motion controller configured to engage at least one face of the work piece and move the work piece inline relative to the apparatus, a fence and a measurement device. The fence is configured to engage a face of the work piece and define a first reference plane along which inline motion of the work piece progresses relative to the apparatus. The measurement device is configured to engage an opposite face to the face of the work piece engaged by the fence to define a second reference plane, the measurement device being further configured to provide a digital measurement of a distance between the first reference plane and the second reference plane to an electronic device.
Mcadoo David L.
Mcadoo Timothy K.
Finlayson & Singlehurst
Illinois Tool Works Inc.
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