System and method for automatic thermal detection of defects...

Details System and method for automatic thermal detection of defects... System and method for automatic thermal detection of defects...

G - Physics

01

R

G01R 31/304 (2006.01) G01N 21/88 (2006.01) G01R 31/308 (2006.01)

Patent

CA 2366340

A system and method using same for automatic detection of defects in electronic circuits, more particularly using the thermal profile of the electronic circuit. A 2- dimensional thermal profile of the electronic circuit is produced and displayed visually. Processing by software is included which determines whether defect conditions exist on the electronic circuit due to local thermal characteristics.

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