G - Physics – 01 – V
Patent
G - Physics
01
V
G01V 13/00 (2006.01) G01R 33/02 (2006.01) G01V 3/00 (2006.01) G01V 3/40 (2006.01) G01V 15/00 (2006.01)
Patent
CA 2180044
A calibration and measurement system for a multi-axial device is disclosed which inciudes a memory for storing a set of test measurement values obtained from the multi-axial device in a substantially uniform field; and a calibration transformation generator for generating from the set of test measurement values to calibrate the multi-axial device, with the set of test measurement values lying on a multi-dimensional surface.
Palstra Thomas T. M.
Telatar Ibrahim Emre
At&t Ipm Corp.
Kirby Eades Gale Baker
LandOfFree
System and method for calibrating multi-axial measurement... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with System and method for calibrating multi-axial measurement..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System and method for calibrating multi-axial measurement... will most certainly appreciate the feedback.
Profile ID: LFCA-PAI-O-1858819