System and method for detection using ultrasonic waves

G - Physics – 01 – S

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G01S 3/80 (2006.01) G06Q 30/00 (2006.01)

Patent

CA 2569974

Described is a system and method for detection using an ultrasonic wave. The system may include a first arrangement and a second arrangement. The first arrangement may include a transmitter and a receiver. The transmitter transmits an ultrasonic wave along a surface on which items are to be stored and the receiver receives the wave after it has passed over the surface. The second arrangement receives from the first arrangement data corresponding to properties of the received wave. The second arrangement compares the properties of the received wave to properties of the transmitted wave to generate current condition value. The second arrangement determines based on the current condition value and calibration data a current condition state corresponding to a degree of the surface currently occupied by the items. The calibration data includes at least one calibration value and a corresponding calibration condition state.

L'invention concerne un système et un procédé de détection utilisant une onde ultrasonore. Ce système peut comporter un premier dispositif et un second dispositif. Le premier dispositif peut comprendre un émetteur et un récepteur. L'émetteur permet de transmettre une onde ultrasonore le long d'une surface, sur laquelle des articles doivent être stockés, et le récepteur permet de recevoir l'onde après son passage au-dessus de la surface. Le second dispositif permet de recevoir du premier dispositif, des données correspondant aux propriétés de l'onde reçue. Le second dispositif permet de comparer les propriétés de l'onde reçue aux propriétés de l'onde transmise afin d'engendrer une valeur de condition actuelle. Le second dispositif permet de déterminer à partir de la valeur de condition actuelle et des données d'étalonnage, un état de condition actuelle correspondant à un degré de la surface actuellement occupée par les articles. Ces données d'étalonnage renferment au moins une valeur d'étalonnage et un état de condition d'étalonnage correspondant.

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