System and method for inspecting a light-management film and...

G - Physics – 01 – N

Patent

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Details

G01N 21/958 (2006.01) G01M 11/00 (2006.01) G01N 21/88 (2006.01)

Patent

CA 2581873

A method of inspecting a light-management film (22) comprises reflecting light from an overhead light source (28) off a first side of the light-management film (22) and examining the light-management film (22) for defects; directing transmission light from a backlight source (I8) through a second side of the light-management film (22) to the first side and examining the light- management film (22) for defects; reflecting light from the overhead light source (28) off the second side of the light-management film (22) and examining the light-management film (22) for defects; directing transmission light from the backlight source (18) through the first side of the light~- management film (22) to the second side and examining the light-management film (22) for defects; and measuring a location of each of the examined defects in the light-~management film (22).

La présente invention concerne un procédé pour inspecter un film de gestion de lumière (22), ledit procédé consistant à: provoquer la réflexion d'une lumière provenant d'une source lumineuse suspendue (28) sur un premier côté du film de gestion de lumière (22) et examiner le film de gestion de lumière (22) pour rechercher des défauts; diriger la lumière de transmission provenant d'une source de rétro-éclairage (18) à travers un second côté du film de gestion de lumière (22) vers le premier côté et examiner le film de gestion de lumière (22) pour rechercher des défauts; provoquer la réflexion de la lumière provenant de la source lumineuse suspendue (28) sur le second côté du film de gestion de lumière (22) et examiner le film de gestion de lumière (22) pour rechercher des défauts; diriger la lumière de transmission provenant de la source de rétro-éclairage (18) à travers le premier côté du film de gestion de lumière (22) vers le second côté et examiner le film de gestion de lumière (22) pour rechercher des défauts; et mesurer un emplacement de chacun des défauts examinés dans le film de gestion de lumière (22).

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