System and method for scanning ir microscopy

Details System and method for scanning ir microscopy System and method for scanning ir microscopy

G - Physics

01

J

G01J 3/28 (2006.01) G02B 21/26 (2006.01) G01J 3/06 (2006.01)

Patent

CA 2457797

An FT-IR microscope is operated in association with a scanning spectrometer in such a way that incremental movement of the movable stage of the microscope is synchronised with the scanning spectrometer. This minimises delays in processing time.

L'invention concerne un microscope IRTF utilisé avec un spectromètre à balayage de façon que tout mouvement supplémentaire de la platine mobile du microscope soit synchronisé avec les balayages du spectromètre à balayage. Cette caractéristique permet de réduire au minimum les retards dans le temps de traitement.

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