System for diagnosing defects in electronic assemblies

Details System for diagnosing defects in electronic assemblies System for diagnosing defects in electronic assemblies

G - Physics

06

F

324/58.2

G06F 11/22 (2006.01) G06F 11/20 (2006.01) G06F 11/25 (2006.01) G06F 11/00 (2006.01) G06F 11/18 (2006.01)

Patent

CA 1288816

ABSTRACT OF THE DISCLOSURE A system (20) for diagnosing defects in electronic assemblies is disclosed. The system (20) comprises a knowledge base (26) for storing information regarding the electronic assembly for receiving current test failure data regarding an electronic assembly (12). The system further comprises a pattern search section (36) for comparing current test failure data to information stored in the knowledge base (26). A voting section (40) is also provided for generating a recommended repair procedure to eliminate the defect in the electronic assembly (12). Finally, the system (20) further comprises a historical pattern generation section (46) which updates the knowledge base (26) with information regarding whether the recommended repair procedure eliminated the defect.

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