System for improved flaw detection in polycrystalline diamond

Details System for improved flaw detection in polycrystalline diamond System for improved flaw detection in polycrystalline diamond

B - Operations, Transporting

01

J

18/1124

B01J 3/06 (2006.01) B21C 3/02 (2006.01) G01N 23/04 (2006.01) G01N 23/18 (2006.01)

Patent

CA 1290124

SYSTEM FOR IMPROVED FLAW DETECTION IN POLYCRYSTALLINE DIAMOND ABSTRACT OF THE DISCLOSURE Disclosed is an improvement enabling a more reliable detection of flaws in polycrystalline diamond compacts by x-ray imaging and especially for compacts used for wire drawing dies. In an embodiment, wire die compacts are prepared having a polycrystalline diamond core disposed within a metal carbide annulus. In the core are uniformly dispersed less than five (5) percent by weight particles such as tungsten carbide which initially have an average particle size substantially less than the diamond particles used to form the polycrystalline mass.

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