System for measuring the refractive index profile of optical...

Details System for measuring the refractive index profile of optical... System for measuring the refractive index profile of optical...

G - Physics

01

M

G01M 11/02 (2006.01) G01N 21/41 (2006.01) G01J 9/04 (2006.01)

Patent

CA 2053724

A system for measuring the refractive index profile of optical components using a monochromatic radiation source and an acousto-optical modulator, which is driven by a periodically varying frequency. The modulator emits a first beam having the same wavelength as the source, and a second beam whose wavelength and emission direction vary with the modulating frequency. After the second beam has been collimated, radiation from both beams is directed towards a component under test and an electrical signal having varying frequency is generated representing of the beat between radiation from the two beams exiting from the component. A spectral analysis of the beat signal is performed, the refractive index value being derived from the position taken by the various frequencies of the beat signal on a detection plane.

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